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Electrical Measurement of Cell-to-Cell Variation of Critical Charge in SRAM and Sensitivity to Single-Event Upsets by Low-Energy Protons



Neutron Radiation Testing of a TMR VexRiscv Soft Processor on SRAM-Based FPGAs



Observation of Low-Energy Proton Direct Ionization in a 72-Layer 3-D NAND Flash Memory



Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization With Neutrons and Alpha Particles



Characterizing Energetic Dependence of Low-Energy Neutron-Induced SEU and MCU and Its Influence on Estimation of Terrestrial SER in 65-nm Bulk SRAM



Classification of Space Particle Events using Supervised Machine Learning Algorithms



A Revised Version of the ATLAS Tile Calorimeter Link Daughterboard for the HL-LHC



Impact of heavy ion energy and species on single-event upset in commercial floating gate cells



Reliability Evaluation of Digital Channelizers Implemented on SRAM - FPGAs



FPGA-Based Implementation of Digital Filters for Image Denoising



Scaling Trends of Digital Single-Event Effects: A Survey of SEU and SET Parameters and Comparison With Transistor Performance



Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study



Impact of Single-Event Upsets on Convolutional Neural Networks in Xilinx Zynq FPGAs



Analysis and Evaluation of the Effects of Single Event Upsets (SEU s) on Memories in Polar Decoders



Design of FPGA-Implemented Reed–Solomon Erasure Code (RS-EC) Decoders With Fault Detection and Location on User Memory



Soft-Error-Immune Read-Stability-Improved SRAM for Multi-Node Upset Tolerance in Space Applications



The Influence of Ion Track Characteristics on Single-Event Upsets and Multiple-Cell Upsets in Nanometer SRAM



Research on Single-Event Vulnerability and Hardening for a Pipelined ADC



Exploiting Hardware Unobservability for Low-Power Design and Safety Analysis in Formal Verification-Driven Design Flows



Correlation of Single-Board Computer Ground-Test Data and On-Orbit Upset Rates From the Gaia Mission



Novel Radiation Hardening Read/Write Circuits Using Feedback Connections for Spin–Orbit Torque Magnetic Random Access Memory



An SRAM-Based Radiation Monitor With Dynamic Voltage Control in 0.18- $\mu$ m CMOS Technology



Functional Failure Rate Due to Single-Event Transients in Clock Distribution Networks



NVRH-LUT: A nonvolatile radiation-hardened hybrid MTJ/CMOS-based look-up table for ultralow power and highly reliable FPGA designs



Design of SRAM-Based Low-Cost SEU Monitor for Self-Adaptive Multiprocessing Systems



Femtosecond Laser Fault Injection into External SRAM Implementations



Strategies for Removing Common Mode Failures From TMR Designs Deployed on SRAM FPGAs



Single-Event-Hardened Timing Generator for waveform digitizer based readout electronics



Fault Tolerant Soft-Core Processor Architecture Based on Temporal Redundancy



Microdosimetry approach for determining single-event upsets in microelectronic devices



Impact of Irradiation Side on Neutron-Induced Single-Event Upsets in 65-nm Bulk SRAMs



Process Variation Aware Analysis of SRAM SEU Cross Sections Using Data Retention Voltage



An Error Location and Correction Method for Memory Based on Data Similarity Analysis



Single-Event Characterization of a Stratix® 10 FPGA Using Neutron Irradiation


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