Esd Behavior(静电放电行为)研究综述
Esd Behavior 静电放电行为 - Finally, ESD behavior of a-Si:H-based TFTs is discussed. [1] According to the principle of equivalent circuit and TCAD(Technology Computer Aided Design) simulation to predict the ESD behavior of the device, and use the transmission line pulse(TLP) for device testing. [2] Influence of piezoelectric field, carrier trapping, and self-heating on ESD behavior is studied. [3]最后,讨论了基于 a-Si:H 的 TFT 的 ESD 行为。 [1] 根据等效电路原理和TCAD(Technology Computer Aided Design)模拟来预测器件的ESD行为,并利用传输线脉冲(TLP)进行器件测试。 [2] 研究了压电场、载流子俘获和自热对 ESD 行为的影响。 [3]