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Comparison of memory effect with voltage or current charging pulse bias in MIS structures based on codoped Si-NCs embedded in SiO2 or HfOx



Reliability and validity of the iSense optical scanner for measuring volume of transtibial residual limb models



Memory effect in MIS structures with embedded all-inorganic colloidal silicon carbide (SiC) nanocrystals



Buffer Vertical Leakage Mechanism and Reliability of 200-mm GaN-on-SOI


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Sense Measurement 센스 측정


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