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Insight into traps at Al2O3/p-GaN metal-oxide-semiconductor interface fabricated on free-standing GaN substrate


GaN MOS Structures with Low Interface Trap Density

Mos Structures sentence examples within Sic Mos Structures



Effect of surface treatments on ALD Al2O3/4H-SiC metal–oxide–semiconductor field-effect transistors


Chemical state of phosphorous at the SiC/SiO 2 interface

Mos Structures sentence examples within Lateral Mos Structures



A Compact Model for Border Traps in Lateral MOS Devices with Large Channel Resistance


Toward Reliable Extraction of the Properties of Border Traps in Lateral GaN Power MOSFET with a Distributed Network Model


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Mos Structures sentence examples within Si Mos Structures



Understanding terahertz emission properties from a metal–insulator–semiconductor structure upon femtosecond laser illumination


Radiation Induced Leakage Current of HfO2-based MOS Capacitors under 60Co Gamma Ray


A New Circuit-Level Technique for Leakage and Short-Circuit Power Reduction of Static Logic Gates in 22-nm CMOS Technology



Principles of experimental research of sensitivity inhomogeneity of matrix sensors



Forming small junctions with reduced defectiveness



A method for characterizing near-interface traps in SiC metal–oxide–semiconductor capacitors from conductance–temperature spectroscopy measurements


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10.1109/ESSCIRC53450.2021.9567747

Cryogenic Characterization of 16 nm FinFET Technology for Quantum Computing



Simulated Analysis of Double-Gate MOSFET and FinFET Structure Using High-k Materials



The Application of the High-k Dielectrics in Lateral Double-Diffused Metal Oxide Semiconductor



CV Stretch-Out Correction after Bias Temperature Stress: Work-Function Dependence of Donor-/Acceptor-Like Traps, Fixed Charges, and Fast States



Investigation of In0.53 Ga0.47 As -Based Buffered Step Doping (BSD) LDMOS



Effect of Annealing on the Surface Morphology and Current–Voltage Characterization of a CZO Structure Prepared by RF Magnetron Sputtering



The Effect of the Ionizing Radiation Intensity on the Response of MOS Structures



CHAPTER 11:Enzymatic and Chemoenzymatic Synthesis of Human Milk Oligosaccharides (HMOS)



Memristive Element Functional Model for Computer Based Analysis and Hardware Emulation of Pulsed Neurons Adaptive Networks



Investigation of ESD Protection in SiC BCD Process



Analysis on Performance of Ferroelectric NC-FETs Based on Real-Space Gibbs-Free Energy With Atomic Channel Structure



A Novel Self-Regulated Potential SOI LIGBT With Low ON-State Voltage and Turn-off Loss


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10.4028/WWW.SCIENTIFIC.NET/MSF.963.230

SiO2/SiC MOSFETs Interface Traps Probed by Nanoscale Analyses and Transient Current and Capacitance Measurements



Investigation of Impact of Dosage on Electrical Properties of Mg-Ion-Implanted GaN before Activation Annealing Using MOS Structures



Enzymatic Cascades for Tailored 13C6 and 15N Enriched Human Milk Oligosaccharides



Features of the field damage of ultra-thin insulating layers of the silicon oxide



Novel gate-grounded NMOS Triggered Device Structures for FD-SOI ESD Protection



On the Reliability Estimation of Analog CMOS Circuits Based on Statistical Methods



High Speed Comparator Design for the Implementation of Successive Approximation Register ADC



Comparative performance study of multiple-input bulk-driven and multiple-input bulk-driven quasi-floating-gate DDCCs



Multiphysics Simulation & Design of Silicon Quantum Dot Qubit Devices



Peculiarities of the method in internal formation of structures in bipolar and CMOS technologies



Stability Criterion of Complex Polynomials in Markov’s Parameters and its’ Application at Selective System’s Design by the D-fragmentation Methods



Square root circuit using FGMOS translinear principle



Progressive Breakdown on Bi-Layered Gate Oxide Stacks



Improvement of the Al2O3/NO2/H-diamond MOS FET by using Au gate metal and its analysis



Time-to-Digital Converters: A Literature Review and New Perspectives



Comparative study on thermal robustness of GaN and AlGaN/GaN MOS devices with thin oxide interlayers


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10.1109/PIERS-Spring46901.2019.9017765

The Study of P-pillar and Trench Technology in VDMOS


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Mos Structures 이끼 구조물


Mos Structures 이끼 구조물
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