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Influence of Inductive Effect in Organic Residuals Content in IZO Thin Films and The Performance on The Behavior of MIS Capacitors on Plastic



Leakage Current Analysis Method for Metal Insulator Semiconductor Capacitors Through Low-Frequency Noise Measurement.



Electrical characterization of high k-dielectrics for 4H-SiC MIS devices



High-quality SiN x /p-GaN metal-insulator-semiconductor interface with low-density trap states



Impact of remote oxygen scavenging on the interfacial characteristics of atomic layer deposited LaAlO3



The Characteristics of Transparent Non-Volatile Memory Devices Employing Si-Rich SiOX as a Charge Trapping Layer and Indium-Tin-Zinc-Oxide



Impacts of Deposition Temperature and Annealing Condition on Ozone-Ethylene Radical Generation-TEOS-CVD SiO2 for Low-Temperature TSV Liner Formation



Impact of γ Radiation on Charge Trapping Properties of Nanolaminated HfO2/Al2O3 ALD Stacks



Impact of border traps in ultrathin metal-organic framework Cu3(BTC)2 based capacitors


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